MFP-3D Atomic Force Microscope Conductive AFM Probe Holder
You can evaluate the electrical properties of small conductive samples with AFM!
The ORCA conductive AFM probe holder allows for conductive AFM imaging and I-V measurements with all Asylum MFP-3D AFM/SPM systems. The standard module can measure currents ranging from approximately 1 pA to 20 nA. Models with different current measurement ranges and dual-gain models are also available. This conductive AFM can simultaneously measure the shape of the sample and the current distribution map. It provides valuable measurements across a wide range of material characteristics, including insulating thin films, ferroelectric films, nanotubes, and conductive polymers.
- Company：オックスフォード・インストゥルメンツ
- Price：Other
